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We will exhibit at ICSCRM 2017 to be held in Washington, D.C.

セラミックフォーラム株式会社 > Ceramicforum Co., Ltd. > News and Topics > We will exhibit at ICSCRM 2017 to be held in Washington, D.C.

Exhibition announcement

Ceramicforum Crystalline Tester

We will exhibit at ICSCRM 2017 in Washington, D.C.

We will also perform demo measurements on our SiC crystal inspection equipment Crystalline Tester CS1. Please come and visit us!
If you bring along SiC / GaN / AlN substrates up to 6-inch in size, we can do demo measurements right at our booth.

CS-1 is an inspection device apparatus making it possible to acquire distribution images of crystal stress induced defects at high speed. Within seconds, non-destructive,
no-touch, full-surface observations of crystalline materials transparent to visible light (400~800nm), such as SiC, GaN or AlN, can be performed.

Comparison of CS1 observation results to x-ray topography

Comparison of CS1 observation results to x-ray topography

In our pamphlet you can find a comparison image of observation results acquired by CS1 to x-ray topography



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Weekdays 9:30-18:00