We will also perform demo measurements on our SiC crystal inspection equipment Crystalline Tester CS1. Please come and visit us!
If you bring along SiC / GaN / AlN substrates up to 6-inch in size, we can do demo measurements right at our booth.
CS-1 is an inspection device apparatus making it possible to acquire distribution images of crystal stress induced defects at high speed. Within seconds, non-destructive,
no-touch, full-surface observations of crystalline materials transparent to visible light (400~800nm), such as SiC, GaN or AlN, can be performed.
In our pamphlet you can find a comparison image of observation results acquired by CS1 to x-ray topography