Ceramic Forum will exhibit at the ECSCRM 2018 in Birmingham/UK.
The European Conference on Silicon Carbide and Related Materials (ECSCRM) is a highly-anticipated event, held every two years, that represents an important international forum that brings together world-leading specialists working in different areas of wide-bandgap semiconductors.Experienced researchers, experts from leading companies and young students interested in this specific scientific domain have a unique opportunity to exchange their views and ideas on the subject in a dynamic environment.
This year we will exhibit:
A) Crystal stress observation tool Crystalline Tester CS1:
→ Inspection tool for observing crystal strain over the entire surface in wide-gap uniaxial single crystal substrates such as SiC, GaN, AlN using transmitted light
B) CP1 - the next generation of our CS1 tool:
→ Non-destructive, non-contact inspection tool to optically identify and distinguish threading screw dislocations (TSD) and threading edge dislocations (TED) in single crystal SiC substrates
C) DLTS Measurement Service
D) Phystech's DLTS measurement system
Additionally, we will present following posters:
1) CS1: Fine structure Analysis of Nitrogen Density Distribution in 4H-SiC substrate (R. Hattori)
2) CP1: Optical discrimination of TSDs and TEDs in 4H-SiC epitaxial layer by phase contrast microscopy method (R. Hattori)
3) Characterization of near interface oxide traps with isothermal constant-capacitance deep-level transient spectroscopy (H. Okada)
Feel free to drop by our booth for more detailed explanations.