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Ceramicforum to exhibit at APWS2019, Okinawa (Nov. 10th〜15th)

セラミックフォーラム株式会社 > Ceramicforum Co., Ltd. > News and Topics > Ceramicforum to exhibit at APWS2019, Okinawa (Nov. 10th〜15th)

Exhibition announcement


Ceramicforum will exhibit at the 9th Asia-Pacific Workshop on Widegap Semiconductors 2019 (APWS2019) in Okinawa/Japan.

About the conference:
The 9th Asia-Pacific Workshop on Widegap Semiconductors (APWS2019) will be held in Onna-son, Okinawa, Japan from November 10 to 15, 2019. The previous eight workshops were held in Awajishima, Japan (APWS2003), Hsinchu, Taiwan (APWS2005), Jeonju, Korea (APWS2007), Zhangjiajie, China (APWS2009), Toba, Japan (APWS2011), New Taipei, Taiwan (APWS2013), Seoul, Korea (APWS2015), and Qingdao, China (APWS2017). Researchers from the Asia and Pacific region will join those from other parts of the world in stimulating discussions on widegap semiconductors.

Widegap semiconductors, including III-nitrides, silicon carbide, oxides, and diamond, have excellent physical properties. There are many obstacles on the road to high-performance optical and electronic devices, including difficulties in epitaxy and device processing. The objective of this workshop is to share high-level research results, spread the understanding of widegap semiconductors through in-depth discussions, and contribute to breakthroughs that can overcome critical technological barriers to improve the performance of widegap semiconductor devices.

This year we will exhibit:
A) Crystal stress observation tool Crystalline Tester CS1:
→ Inspection tool for observing crystal strain over the entire surface in wide-gap uniaxial single crystal substrates such as SiC, GaN, AlN using transmitted light
B) CP1 - the next generation of our CS1 tool:
→ Non-destructive, non-contact inspection tool to optically identify and distinguish  threading screw dislocations (TSD) and threading edge dislocations (TED) in single crystal SiC substrates
C) DLTS Measurement Service
D) Phystech's DLTS measurement system
E) TMX Scientific's thermal reflectance based thermal imaging equipment
F) Saphlux semi-polar GaN templates and substrates
G) SweGaN's state-of-the-art GaN-on-SiC technology

Looking forward to meeting you at our booth!
Conference information
Conference name: APWS 2019
Place: Okinawa Institute of Science and Technology Graduate University (OIST), Okinawa, Japan
Booth No: 7
Date: November 10th-15th 2019
Websitehttp://www.apws2019.jp/
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