Introduction to semiconductor inspection equipment handled by Ceramic Forum.
Windows based software, various functions and measurement modes, new measurement / analysis modes for separating overlapping emission signals up to three times the value of the time constant.
Developed to a perfect resolution.The world's fastest, highest quality RAMAN imaging
Conceptual photoluminescence spectrometer providing functions essential to engineers; "Just right" and with a "Low price".
Non-contact and non-destructive observation of the distribution of crystal strain caused by stress and residual defects in crystal materials such as GaN, SiC, AlN substrates etc.