Ceramic Forum, Glass Manufacturing Technology and Wide-Gap Semiconductors

Weekdays: 9:30- 18:00

About DLTS

At Ceramic Forum, we have begun measurement and analysis services for defect evaluation in semiconductor materials / devices, by the DLTS (Deep Level Transient Spectroscopy) method.
We will explain in detail the DLTS method adopted by our company.

For any questions or requests regarding our services please feel free to contact us via phone or inquiry form.
For Telephone Inquiries
Weekdays 9:30-18:00