About DLTS

セラミックフォーラム株式会社 > Ceramicforum Co., Ltd. > About DLTS

At Ceramic Forum, we have begun measurement and analysis services for defect evaluation in semiconductor materials / devices, by the DLTS (Deep Level Transient Spectroscopy) method.
We will explain in detail the DLTS method adopted by our company.

DLTS Method

Phystech DLTS Measuring Device (FT1030)

HERA-DLTS System Specification

Evaluation and Analysis Services

Detailed Explanation of DLTS Method

About DLTS

For any questions or requests regarding our services please feel free to contact us via phone or inquiry form.

For Telephone Inquiries

03-5577-2947

Weekdays 9:30-18:00

For WEB Inquiries

General Inquiry
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